Hauptmenü
  • Autor
    • Albu, Mihaela
    • Hofer, Ferdinand
  • TitelEffects of trace elements (Y and Ca) on the eutecetic Ge in Al-Ge based alloys
  • Volltext
  • DOI10.1016/j.actamat.2016.03.043
  • Persistent Identifier
  • Erschienen inActa materialia
  • Band111
  • Erscheinungsjahr2016
  • Seiten85-95
  • LicenceCC-BY
  • ZugriffsrechteCC-BY
  • Download Statistik91
  • Peer ReviewJa
  • AbstractEffects of trace elements (0.2Y and 0.2Ca (wt%) on the eutectic Ge in high purity Ale20Ge (wt%) alloys were investigated by multi-scale microstructure characterization techniques. Particularly, the distribution of trace elements (Y and Ca) within the eutectic Ge and/or at the interface between eutectic Ge and<br/>eutectic Al was investigated by atomic resolution high angle annular dark field scanning transmission electron microscopy (HAADF-STEM) imaging and atom probe tomography (APT). The combined investigations indicate AleY and AleCa co-segregations. Such co-segregations change significant morphology and growth of the eutectic Ge. In addition, large Al2Ge2Y and Al2Ge2Ca phases were also measured. The modification of eutectic Ge is discussed in terms of previously postulated modification mechanisms: twin plane re-entrant edge growth mechanism, impurity-induced twinning, and growth restriction of eutectic Ge.